A Multi-level Sketch-based Interface
for Decorative Pattern Exploration

SIGGRAPH Asia 2016 Technical Brief

Yilan Chen, Hongbo Fu, Kin Chung Au

Our system allows users to sketch in multiple levels (Left) for decorative pattern exploration (Right: top-7 retrieved results).


Despite the extensive usage of decorative patterns in art and design, there is a lack of intuitive ways to find a certain type of patterns. In this paper, we present a multi-level sketch-based interface that incorporates low-level geometrical features and high-level structural features, namely reflection, rotation, and translation symmetries, to support decorative pattern exploration at different levels of detail. Four brush tools are designed for users to specify any combination of such features and compose a hybrid search query. The results of a pilot study show that users are able to perform pattern retrieval tasks using our system easily and effectively.


We thank the reviewers for their constructive comments, the user study participants for their time. We are grateful to Pixabay and Flickr for their rich resources of decorative patterns. The work described in this paper was partially supported by grants from the Research Grants Council of the Hong Kong Special Administrative Region, China (Project No. CityU113513, CityU11204014).